DocumentCode
2954091
Title
Optical correlation technique for characterizing of rough surfaces
Author
Angelsky, O.V.
Author_Institution
Correlation Opt. Dept., Chernivtsy Univ., Ukraine
fYear
2000
fDate
10-15 Sept. 2000
Abstract
Summary form only. It is known that power spectral density function, (PSDF), describing inhomogeneity distribution among different spatial frequencies is considered as preferable and the most comprehensive technique. But conventional profilometric techniques for reconstruction of PSDF are rather labor- and time-consuming and are implemented using expensive measuring equipment. In the report we will consider as example a new optical correlation measuring device for estimation of PSDF of slightly rough surfaces. Our device is based on polarization interferometer consisting of the tandem of two identical calcite wedges forming a plane-parallel plate, which are placed between the crossed linear polarisers.
Keywords
light interferometry; optical correlation; optical polarisers; surface topography measurement; PSDF; calcite wedges; correlation measuring device; crossed linear polarisers; inhomogeneity distribution; optical correlation technique; plane-parallel plate; polarization interferometer; power spectral density function; profilometric techniques; rough surface measurement; slightly rough surface measurement; spatial frequencies; Delay; Ellipsoids; Frequency estimation; Holographic optical components; Holography; Optical surface waves; Rough surfaces; Surface reconstruction; Surface roughness; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on
Conference_Location
Nice
Print_ISBN
0-7803-6319-1
Type
conf
DOI
10.1109/CLEOE.2000.910193
Filename
910193
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