Title :
Using 10 V Josephson voltage standards to estimate the uncertainty of Zener voltage references as travelling standards
Author :
Lo-Hive, J.P. ; Reymann, D. ; Geneves, G.
Author_Institution :
BNM-LCIE, Fontenay-aux-Roses, France
Abstract :
In anticipation of the start of a European comparison of 10 V Josephson array voltage standards (EUROMET project 429 led by NMi VSL), the BIPM and the BNM-LCIE Josephson standards have been compared by means of Zener travelling references. An overall spread of 5 parts in 10/sup 9/ has been found with a standard uncertainty of 6 parts in 10/sup 9/. These results show that the performance of the Zener references could be the main cause of uncertainty in such a comparison.
Keywords :
Zener diodes; measurement standards; measurement uncertainty; superconducting junction devices; voltage measurement; 10 V; BIPM; BNM-LCIE; EUROMET project; Josephson array voltage standard; Zener voltage reference; measurement uncertainty; travelling standard; Availability; Battery charge measurement; Laboratories; Measurement standards; Niobium; Switches; Temperature; Uncertainty; Video recording; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699945
