• DocumentCode
    2954512
  • Title

    Investigation of muscle behavior during different functional electrical stimulation profiles using Mechanomyography

  • Author

    Scheeren, Eduardo M. ; Nogueira-Neto, Guilherme N. ; Krueger-Beck, Eddy ; Button, Vera Lúcia S N ; Nohama, Percy

  • Author_Institution
    Fed. Technol. Univ. of Parana, Curitiba, Brazil
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 4 2010
  • Firstpage
    3970
  • Lastpage
    3973
  • Abstract
    Mechanomyography (MMG) is a technique for measuring muscle oscillations and fatigue. Functional electrical stimulation (FES) has been applied to control movements mainly in people with spinal cord injury (SCI). The goal of this study is the application of the MMG signal as a tool to investigate muscle response during FES. Ten healthy individuals (HI) and three SCI were submitted to four FES profiles in the rectus femoris (RF) and vastus lateralis (VL) muscles. Four FES profiles were applied in different days. The FES profile set to 1 kHz pulse frequency, 200 us active pulse duration and burst frequency of 50 Hz presented the lowest MMG root mean square and spectral median frequency values, suggesting less muscle modification. The MMG signal was different between HI and SCI but there was no difference between the RF and VL muscles.
  • Keywords
    biomedical measurement; fatigue; medical signal processing; neuromuscular stimulation; 32nd; MMG root mean square; MMG signal; frequency 50 Hz to 1 kHz; functional electrical stimulation profiles; mechanomyography; muscle fatigue; muscle modification; muscle oscillations; rectus femoris muscle; spectral median frequency values; spinal cord injury; vastus lateralis muscle; Fatigue; Humans; Muscles; Neuromuscular stimulation; Protocols; Radio frequency; Sensors; Electric Stimulation; Electromyography; Humans; Muscle, Skeletal;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
  • Conference_Location
    Buenos Aires
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4123-5
  • Type

    conf

  • DOI
    10.1109/IEMBS.2010.5627986
  • Filename
    5627986