Title :
Relationship Between Loaded Quality Factor and Responsivity for NbN-Based MKIDs Using Dual-Function Spiral Strip
Author :
Saito, A. ; Nakajima, K. ; Hayashi, K. ; Ogawa, Y. ; Okuyama, Y. ; Oka, D. ; Ariyoshi, S. ; Yamada, H. ; Taino, T. ; Otani, C. ; Bae, J. ; Ohshima, S.
Author_Institution :
Nagoya Inst. of Technol., Nagoya, Japan
Abstract :
We investigated the relationship between loaded quality factor (QL) and responsivity of microwave kinetic inductance detectors (MKIDs) using a dual-function spiral strip (DFSS). Three types of DFSSs with different QL values were designed, and the S21 properties were simulated when kinetic inductance of a superconductor was changed by using a 2.5-dimentional simulator. The simulated results showed that a very high QL value was not necessarily required. The resonator frequencies of the 25-MKID array using a better type of DFSS (QL ~ 3500) were adjusted to be separated by 5 MHz around 2.0 GHz. The 25-MKID array were fabricated using 20-nm thick niobium nitride films deposited on r-plane sapphire substrates. We clearly observed 25 half-wavelength resonances around 2.0 GHz at 2.245 K. The optical responses were also confirmed using hot and cold radiation. The dependence of the responsivity on the QL indicated that the QL value of approximately 2000 could obtain higher responsivity.
Keywords :
Q-factor; microwave detectors; niobium compounds; superconducting microwave devices; 2.5-dimentional simulator; 25-MKID array; DFSS; NbN; NbN-based MKIDs; QL; S21 properties; cold radiation; dual-function spiral strip; half-wavelength resonances; hot radiation; kinetic inductance; loaded quality factor; microwave kinetic inductance detector responsivity; niobium nitride films; optical responses; r-plane sapphire substrates; size 20 nm; superconductor; temperature 2.245 K; Arrays; Detectors; Films; Inductance; Kinetic theory; Resonant frequency; Spirals; Array; THz; array; dual-function spiral strip (DFSS); microwave; microwave kinetic inductance detector (MKID);
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2367459