Optimization of Nanoelectronic Systems Reliability Under Massive Defect Density Using Distributed R-fold Modular Redundancy (DRMR)

The theoretical analysis of R-fold modular redundancy with distributed voters -- distributed R-fold modular redundancy, in terms of reliability is presented for the first time to the best of author´s knowledge. This technique is compared in terms of resistance to massive levels of defect density expected in future nano-devices to R-fold modular redundancy with a single voter, cascaded R-fold modular redundancy and NAND multiplexing. Optimal partition size analysis and redundancy optimization of distributed R-fold modular redundancy technique has been performed for the first time in the context of a large-scale system. The optimal window of application of different fault-tolerant techniques with respect to defect density is presented as a way to find the optimum design trade-off between the reliability and power/area.