DocumentCode :
2956633
Title :
A Fault Analysis and Classifier Framework for Reliability-Aware SRAM-Based FPGA Systems
Author :
Bolchini, Cristiana ; Castro, Fabrizio ; Miele, Antonio
Author_Institution :
Dip. Elettron. e Inf., Politec. di Milano, Milan, Italy
fYear :
2009
fDate :
7-9 Oct. 2009
Firstpage :
173
Lastpage :
181
Abstract :
This paper presents a new framework for the analysis of SRAM-based FPGA systems with respect to their dependability properties against single, multiple and cumulative upsets errors. The aim is to offer an environment for performing fault classification and error propagation analyses for designed featuring fault detection or tolerance techniques against soft errors, where the focus is not only the overall achieved fault coverage, but an understanding of the fault/error relation inside the internal elements of the system. We propose a fault analyzer/classifier laying on top of a classical fault injection engine, used to monitor the evolution of the system after a fault as occurred, with respect to the applied reliability-oriented design technique. The paper introduces the framework and reports some experimental results of its application to a case study, to highlight the benefits of the proposed solution.
Keywords :
SRAM chips; fault simulation; field programmable gate arrays; logic design; FPGA; SRAM; classifier framework; error propagation; fault analysis; fault classification; field programmable gate arrays; soft errors; static RAM; tolerance techniques; Engines; Error analysis; Fault detection; Fault tolerant systems; Field programmable gate arrays; Monitoring; Paper technology; Performance analysis; Statistical analysis; Very large scale integration; FPGA; Fault Analysis; Fault Injection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location :
Chicago, IL
ISSN :
1550-5774
Print_ISBN :
978-0-7695-3839-6
Type :
conf
DOI :
10.1109/DFT.2009.10
Filename :
5372258
Link To Document :
بازگشت