Title :
Unstructured light scanning to overcome interreflections
Author :
Couture, Vincent ; Martin, Nicolas ; Roy, Sébastien
Author_Institution :
Univ. de Montreal, Montreal, QC, Canada
Abstract :
Reconstruction from structured light can be greatly affected by interreflections between surfaces in the scene. This paper introduces band-pass white noise patterns designed specifically to reduce interreflections, and still be robust to standard challenges in scanning systems such as scene depth discontinuities, defocus and low camera-projector pixel ratio. While this approach uses unstructured light patterns that increase the number of required projected images, it is up to our knowledge the first method that is able to recover scene disparities in the presence of both scene discontinuities and interreflections. Furthermore, the method does not require calibration (geometric nor photometric) or post-processing such as dynamic programming or phase unwrapping. We show results for a challenging scene and compare them to correspondences obtained with the well-known Gray code and Phase-shift methods.
Keywords :
image reconstruction; band-pass white noise patterns; gray code; interreflections; low camera-projector pixel ratio; phase-shift method; scanning systems; scene depth discontinuities; scene discontinuities; unstructured light patterns; unstructured light scanning; Band pass filters; Calibration; Cameras; Lighting; Noise; Reflective binary codes; Robustness;
Conference_Titel :
Computer Vision (ICCV), 2011 IEEE International Conference on
Conference_Location :
Barcelona
Print_ISBN :
978-1-4577-1101-5
DOI :
10.1109/ICCV.2011.6126458