Title :
Corrosion of Pb-50In flip chip interconnections exposed to harsh environment
Author :
Puttlitz, Karl J.
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
Abstract :
Lead-indium alloys are an alternative to lead-tin solders commonly used for interconnections in the electronics industry. Lead-indium alloys with 25 to 50 wt.% In provide the advantage of a substantially lower process temperature and overall exhibit a much lower tendency to scavenge gold compared to Pb-Sn solders with high Pb content. However, a corrosion problem has been identified in connection with Pb-50In solders, an alloy of interest owing to its thermal-fatigue resistance property. The author presents the results of a study conducted to gain a fundamental understanding of the nature and path of corrosion in Pb-50In flip-chip connections exposed to an accelerated hostile-environment test simulating harsh industrial ambients. The key events in the corrosion process are identified and discussed
Keywords :
corrosion fatigue; corrosion testing; flip-chip devices; indium alloys; lead alloys; life testing; Pb-In; accelerated hostile-environment test; corrosion problem; flip chip interconnections; harsh environment; industrial ambients; process temperature; thermal-fatigue resistance property; Ceramics; Corrosion; Flip chip; Gold alloys; Lead; Life estimation; Milling machines; Packaging; Testing; Thermal resistance;
Conference_Titel :
Electronic Components Conference, 1989. Proceedings., 39th
Conference_Location :
Houston, TX
DOI :
10.1109/ECC.1989.77786