A broadband technique for one-port VNA calibration and characterization of low-loss two-ports

Author

Wiatr, W.

Author_Institution

Warsaw Univ. of Technol., Poland

fYear

1998

fDate

6-10 July 1998

Firstpage

432

Lastpage

433

Abstract

A broadband versatile technique for precision one-port calibration of VNA is presented. It is an extension of a previous sliding short method, but accommodating a broader class of calibration devices, such as delayed short and open circuits. It features a high measurement redundancy that allows the delays and losses of these devices to be determined during the calibration. The new method is suitable for measurement of low-loss two-ports.

Keywords

calibration; loss measurement; measurement uncertainty; network analysers; redundancy; reflectometers; swept-frequency reflectometry; two-port networks; adapter efficiency; attenuation constant; broadband technique; calibration technique; delayed short; high accuracy; high measurement redundancy; least squares fitting; low-loss two-ports; one-port vector network analyser; open circuits; overdetermined technique; reflection coefficient transformation; sliding short method; uncertainty; Calibration; Circuits; Delay; Loss measurement; Measurement uncertainty; Power measurement; Redundancy; Reflection; Spirals; Tuners;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 1998 Conference on

Conference_Location

Washington, DC, USA

Print_ISBN

0-7803-5018-9

Type

conf

DOI

10.1109/CPEM.1998.699988

Filename

699988