DocumentCode :
2962855
Title :
Yield modeling and yield-aware mapping for application specific networks-on-chip
Author :
Khalilinezhad, Seyyed Hassan ; Reza, Akram ; Reshadi, Midia
Author_Institution :
Dept. of Comput. Eng., Islamic Azad Univ., Tehran, Iran
fYear :
2011
fDate :
14-15 Nov. 2011
Firstpage :
1
Lastpage :
4
Abstract :
Network-on-chip has been proposed as an interconnection solution for increasing number of cores on chips. Increasing number of cores affects the yield of the devices and systems that make use of the multi core chips. Two major factors that affect the system yield are routers and links yield. We propose a yield model which uses variable router yield for the system. Based on this model, a yield aware mapping is proposed. Our proposed mapping algorithm improves yield up to 30 percent. Although the algorithm has decreased power consumption up to 15 percent, it has caused delay to increase 39 percent.
Keywords :
application specific integrated circuits; integrated circuit interconnections; integrated circuit yield; multiprocessing systems; network-on-chip; application specific networks-on-chip; interconnection solution; multi core chips; yield modeling; yield-aware mapping; Algorithm design and analysis; Reliability engineering; Very large scale integration; Yield; fault tolerance; network-on-chip (NOC); reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
NORCHIP, 2011
Conference_Location :
Lund
Print_ISBN :
978-1-4577-0514-4
Electronic_ISBN :
978-1-4577-0515-1
Type :
conf
DOI :
10.1109/NORCHP.2011.6126733
Filename :
6126733
Link To Document :
بازگشت