DocumentCode :
2962921
Title :
Author index
fYear :
1998
fDate :
26-26 March 1998
Firstpage :
239
Lastpage :
240
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on
Conference_Location :
Kanazawa, Japan
Print_ISBN :
0-7803-4348-4
Type :
conf
DOI :
10.1109/ICMTS.1998.688104
Filename :
688104
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2962921