مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2962921

Title :

Author index

fYear :

1998

fDate :

26-26 March 1998

Firstpage :

239

Lastpage :

240

Abstract :

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on

Conference_Location :

Kanazawa, Japan

Print_ISBN :

0-7803-4348-4

Type :

conf

DOI :

10.1109/ICMTS.1998.688104

Filename :

688104

Link To Document :