Title :
Dependence of contact resistance on current for good and bad ohmic contacts to quantized Hall resistors
Author_Institution :
Div. of Electr., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Dependence of contact resistance on current has been measured for a large number of ohmic contacts to quantized Hall resistors under quantum Hall effect conditions. A definite trend is observed in the current dependences of resistances of good and bad contacts, regardless of the physical cause of the poor contact.
Keywords :
contact resistance; electric resistance measurement; measurement standards; ohmic contacts; quantum Hall effect; resistors; two-dimensional electron gas; 2DEG scattering; contact resistance; corrosion; current dependence; damaged contacts; ideal contact; limiting case; ohmic contacts; potential probe contacts; quantized Hall resistors; quantum Hall effect conditions; resistance standards; Contact resistance; Current measurement; Electrical resistance measurement; NIST; Ohmic contacts; Particle measurements; Probes; Resistors; Resists; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.700013
