Title :
A correlation model for MAC protocols in event-driven wireless sensor networks
Author :
Shakya, Rajeev K. ; Singh, Yatindra Nath ; Verma, Nishchal K.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., Kanpur, Kanpur, India
Abstract :
In event-driven scenario, each event triggers a large number of nodes for sensing and transmission, thus the nodes encounter spatially-correlated contention due to correlation between nodes in spatial domain. To mitigate the correlated contention inside event area, a correlation model is proposed to describe the correlation characteristics of sensor nodes using sensing coverage of nodes. The C-INS algorithm using correlation model is introduced to exploit the spatial correlation inside the event area. Further, a random correlated event traffic model for NS-2 network simulator is developed to apply the results of model with existing MAC protocols for measuring the effectiveness of proposed C-INS algorithm. The simulation results using MAC protocols show that by exploiting spatial correlation network performance in terms of energy consumption and delay guarantee improves drastically. The analytical results of proposed correlation model also indicates better spatial correlation between nodes for higher density of nodes and larger sensing range.
Keywords :
access protocols; correlation methods; energy consumption; telecommunication traffic; wireless sensor networks; C-INS algorithm; MAC protocol; NS-2 network simulator; correlation characteristics; correlation model; delay guarantee; energy consumption; event-driven wireless sensor network; node density; random correlated event traffic model; sensing coverage; sensing node; sensor node; spatial correlation network performance; spatial domain; spatially-correlated contention; transmission node; Correlation; Protocols; Wireless sensor networks; Energy-Efficient MAC protocols; Wireless Sensor Network; performance analysis;
Conference_Titel :
TENCON 2012 - 2012 IEEE Region 10 Conference
Conference_Location :
Cebu
Print_ISBN :
978-1-4673-4823-2
Electronic_ISBN :
2159-3442
DOI :
10.1109/TENCON.2012.6412198