Title :
Estimating the inquiring time interval for the patent analysis by the technology obsolescence cycle
Author :
Wu, Hsiao-Chung ; Chen, Hung-Yi
Author_Institution :
Dept. of Bus. Adm., Chaoyang Univ. of Technol., Taichung, Taiwan
Abstract :
One of key issues in patent analysis is identifying time interval for querying patent records from databases. Inquiring patents with inappropriate time interval will lead to biased results that either emphasizes old patents or cannot reveal the structure of a technology area. The study proposed a systematic method for deciding the inquiring time interval, based on the patent´s obsolescence cycle. Two USPC classes are analyzed for demonstrating. For including at least of 90% of survival patents, the study suggests the time interval of 9.2 years for the pure USPC 257 class. Use the time interval of 7.0 years for patents in the pure USPC 438 class. Use the time interval of 7.5 years for patents classified both in the USPC 257 and 438 classes.
Keywords :
patents; query processing; patent analysis; patent obsolescence cycle; patent record query; systematic method; technology obsolescence cycle; Bibliometrics; Chaos; Contracts; Databases; Electronics industry; Government; Information analysis; Intellectual property; Semiconductor device manufacture; Time measurement; Patent analysis; inquiring time interval; obsolescence cycle;
Conference_Titel :
Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4869-2
Electronic_ISBN :
978-1-4244-4870-8
DOI :
10.1109/IEEM.2009.5372992
