• DocumentCode
    2965771
  • Title

    A single chip fluorometer for fluorescence lifetime spectroscopy in 65nm CMOS

  • Author

    Guo, Jian ; Sonkusale, Sameer

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
  • fYear
    2011
  • fDate
    28-31 Oct. 2011
  • Firstpage
    766
  • Lastpage
    769
  • Abstract
    This paper presents a low-power CMOS fluorometer that utilizes the frequency-domain fluorescence lifetime spectroscopy for oxygen sensing applications. The proposed fluorometer consists of a P+-buried/N-Well/P-Substrate photodiode for optical sensing, a novel phase readout circuit with integrated zero-crossing detection for extracting the frequency-domain phase-shift into a time-domain delay signal, and a high resolution Time-to-Digital Converter (TDC) for direct digital output generation. A prototype chip has been fabricated in a low-power 65nm CMOS technology and has been characterized via a sequence of oxygen sensing experiments, during which the fluorescence lifetime of a Ruthenium complex based oxygen sensor is measured as a function of the oxygen concentration. With only 370μW power consumption, the proposed fluorometer architecture and its unique phase readout scheme offer an attraction solution for developing low-power, low cost, and highly integrated devices for time-resolved fluorescence spectroscopy.
  • Keywords
    CMOS digital integrated circuits; chemical variables measurement; fluorescence spectroscopy; gas sensors; low-power electronics; oxygen; photodiodes; radiative lifetimes; spectrochemical analysis; O2; P+-buried/N-well/P-substrate photodiode; direct digital output generation; frequency-domain fluorescence lifetime spectroscopy; frequency-domain phase-shift; high resolution time-to-digital converter; integrated zero-crossing detection; low-power CMOS fluorometer; optical sensing; oxygen concentration; oxygen sensing applications; phase readout circuit; power 370 muW; ruthenium complex based oxygen sensor; single chip fluorometer; size 65 nm; time-domain delay signal; time-resolved fluorescence spectroscopy; CMOS integrated circuits; Frequency domain analysis; Frequency modulation; Optical variables measurement; Phase measurement; Sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2011 IEEE
  • Conference_Location
    Limerick
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-9290-9
  • Type

    conf

  • DOI
    10.1109/ICSENS.2011.6126967
  • Filename
    6126967