Title :
New generation of electrical resistance standards
Author :
Zaslavski, V.A. ; Warnecke, P. ; Leontiew, H. ; Pesel, E. ; Schumacher, B.
Author_Institution :
ZIP-Nauchpribor Ltd., Krasnodar, Russia
Abstract :
Investigations of new generation resistance standards with the heightened stability to changes of air pressure, which intended for use as a traveling 100 Ohm resistance standard during international comparison of QHR. The measurements were performed in the range from 800 to 1050 mbar using a temperature regulated pressure cell.
Keywords :
electric resistance measurement; measurement uncertainty; quantum Hall effect; transfer standards; 100 ohm; 800 to 1050 mbar; electrical resistance standards; error budget; international comparison; new generation standards; quantized Hall resistance; standard uncertainty; temperature regulated pressure cell; traveling resistance standard; Cryogenics; Electric resistance; Electrical resistance measurement; Ocean temperature; Performance evaluation; Petroleum; Pressure measurement; Resistors; Stability; Temperature distribution;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.700036