Title :
Acoustic waves investigation in solids by atomic force microscopy
Author :
Snitka, V. ; Rackaitis, M. ; Baranauskas, V. ; Fukui, M.
Author_Institution :
Vibrotechnika Res. Inst., Kaunas, Lithuania
Abstract :
In this study we present a novel method to investigate the acoustic and surface vibrations by Atomic Force Microscopy (AFM). The piezoelectric plate vibrations were investigated in the frequency range 10-120 kHz. The investigations were carried out by contact and non-contact modes on surfaces both coated and not by thin metal films. The experimental results show the possibility of measuring vibration amplitude and electric field distribution. A strong interaction was observed between the tip and vibrating piezoelectric plate electric field. The possibility of controling the tip-surface adhesion by vibrations are shown here. The resonant tangential vibrations decreased tip-surface adhesion from 120 nN to zero. The vibrations have shown a weak influence on the measured surface image, at the same time as the average tip position shift was observed
Keywords :
atomic force microscopy; electric fields; microscopy; surface phonons; ultrasonic measurement; ultrasonic waves; vibration measurement; 10 to 120 kHz; AFM; acoustic waves investigation; atomic force microscopy; contact mode; electric field distribution; noncontact mode; piezoelectric plate vibrations; solids; surface vibrations; tip-surface adhesion; vibration amplitude; Acoustic measurements; Acoustic waves; Adhesives; Atomic force microscopy; Atomic measurements; Frequency; Piezoelectric films; Solids; Surface acoustic waves; Vibration measurement;
Conference_Titel :
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2940-6
DOI :
10.1109/ULTSYM.1995.495632