• DocumentCode
    2968089
  • Title

    Numerical Dispersion of the ADI-FDTD Technique Including Lumped Models

  • Author

    Qing-xin, Chu ; Zhi-hui, Chen

  • Author_Institution
    South China Univ. of Technol., Guangzhou
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    729
  • Lastpage
    732
  • Abstract
    The numerical dispersion characteristic of the extended ADI-FDTD algorithm including lumped models is systematically studied in this paper, and three common lumped models are investigated: resistor, capacitor and inductor, and their explicit, semi-implicit, and implicit temporal difference scheme are discussed. Theoretical results show that: (1) in the explicit and implicit case, the dispersion nature of a lumped resistor can be characterized by a series inductor and a series capacitor, respectively. (2) For capacitor, the dissipative nature of the explicit scheme can be replaced by a paralleling resistor. (3) If the semi-implicit or implicit scheme is applied to the lumped inductor, the dissipative inductor can be replaced by an equivalent circuit consisting of an inductor and a series resistor. Finally, a simple microstrip circuit including a lumped inductor is simulated to demonstrate the validity of the theoretical results.
  • Keywords
    capacitors; finite difference time-domain analysis; inductors; lumped parameter networks; microstrip circuits; microwave circuits; resistors; ADI-FDTD technique; alternating-direction implicit FDTD algorithm; dissipative inductor; equivalent circuit; implicit temporal difference scheme; lumped inductor; lumped resistor; microstrip circuit; numerical dispersion characteristics; paralleling resistor; series capacitor; series inductor; Capacitors; Circuit simulation; Educational institutions; Equivalent circuits; Finite difference methods; Inductors; Microstrip; Numerical models; Resistors; Time domain analysis; ADI-FDTD; explicit; implicit; lumped models; numerical dispersion; semi-implicit;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380042
  • Filename
    4263921