Title :
Quasi-optical waveguide W-band spectrometer for precision dielectric measurement of absorbing materials
Author :
Afsar, M.N. ; Tkachov, I.I. ; Kocharyan, K.N.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Tufts Univ., Medford, MA, USA
Abstract :
A quasi-optical waveguide bridge spectrometer is designed and constructed for the precision measurement of dielectric permittivity and loss tangent of medium and highly absorbing materials over an extended W-band frequency range. An electronically sweeping backward wave oscillator (BWO) is used as a source of tunable coherent radiation in the frequency range 70-118 GHz. The high output power of BWO (typically 50-100 mW at each frequency) and high sensitivity receiver system employing a liquid helium cooled InSb detector enable the accurate transmission measurement of highly absorbing materials. Data for very absorbing materials such as the low resistivity silicon and germanium are presented and compared.
Keywords :
backward wave oscillators; bridge instruments; dielectric loss measurement; electromagnetic wave transmission; elemental semiconductors; germanium; microwave measurement; microwave spectrometers; millimetre wave measurement; millimetre wave spectroscopy; permittivity measurement; silicon; waveguides; 70 to 118 GHz; Ge; Si; W-band spectrometer; accurate transmission measurement; dynamic range; electronically sweeping backward wave oscillator; extended W-band frequency range; high sensitivity receiver system; highly absorbing materials; liquid helium cooled InSb detector; loss tangent measurement; low resistivity germanium; low resistivity silicon; medium absorbing materials; permittivity measurement; precision dielectric measurement; quasi-optical waveguide bridge spectrometer; tunable coherent radiation source; Bridges; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Frequency measurement; Loss measurement; Oscillators; Permittivity measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.700040