Direct measurement of standard cells with a Josephson junction array voltage standard

Author

Katkov, A. ; Niemeyer, J. ; Behr, R.

Author_Institution

Inst. for Metrol., St. Petersburg, Russia

fYear

1998

fDate

6-10 July 1998

Firstpage

552

Lastpage

553

Abstract

The dynamic parameters of standard cells in a circuit for the direct measurement of a standard cell with a Josephson junction array voltage standard were analysed. The parameters of the models of a null-detector and a standard cell were experimentally determined. It was found that it is possible to directly measure a standard cell with a voltage standard, with an uncertainty of about 0.001 ppm.

Keywords

calibration; cellular arrays; function generators; integrated circuit measurement; measurement standards; measurement uncertainty; superconducting junction devices; voltage measurement; Josephson junction array voltage standard; Nyquist noise; calibration circuit; direct measurement; dynamic parameters; nanovoltmeter; null-detector models; standard cells; uncertainty; voltage jumps influence; voltage restoration time; Battery charge measurement; Circuits; Detectors; Diodes; Equations; Gears; Gold; Josephson junctions; Measurement standards; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 1998 Conference on

Conference_Location

Washington, DC, USA

Print_ISBN

0-7803-5018-9

Type

conf

DOI

10.1109/CPEM.1998.700051

Filename

700051

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2970001