• DocumentCode
    2970020
  • Title

    Development of probes for cochlear implants

  • Author

    Lawand, Nishant S. ; French, Paddy J. ; Briaire, J.J. ; Frijns, J.H.M.

  • Author_Institution
    Electron. Instrum. Lab., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2011
  • fDate
    28-31 Oct. 2011
  • Firstpage
    1827
  • Lastpage
    1830
  • Abstract
    In this paper the development of the probes with respect to the fabrication aspect is shown. The stiff probe is formed by defining the probe thickness and releasing at the end by deep reactive ion etching. These stiff probes were fabricated in order to study the problems involved in the fabrication procedure and the behaviour of the probes when they are inserted perpendicular to the auditory nerve. The probes were fabricated with lengths ranging from 3.5 mm up to 13.5 mm and thickness between 50 to 60 microns.
  • Keywords
    cochlear implants; microfabrication; probes; sputter etching; auditory nerve; cochlear implants; deep reactive ion etching; fabrication procedure; probe thickness; probes development; stiff probe; Arrays; Cochlear implants; Electrodes; Etching; Fabrication; Probes; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2011 IEEE
  • Conference_Location
    Limerick
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-9290-9
  • Type

    conf

  • DOI
    10.1109/ICSENS.2011.6127178
  • Filename
    6127178