DocumentCode :
2970300
Title :
Multi-frequency ultrasonic NDE for early defect recognition and imaging
Author :
Pfleiderer, K. ; Aufrecht, J. ; Solodov, I. ; Busse, G.
Author_Institution :
Dept. of Non-Destructive Testing, Stuttgart Univ., Germany
Volume :
1
fYear :
2004
fDate :
23-27 Aug. 2004
Firstpage :
693
Abstract :
The nonlinear response of flaws results in frequency changes which can be used for NDE (nondestructive evaluation). We report on the observation and NDE application of the ultimate nonlinear spectrum which (beyond the well-known ultra-harmonics and modulation side-bands) comprises sub-harmonics, ultra-subharmonics and ultra-frequency pairs. The experiments include 20-40 kHz intense acoustic wave excitation and local spectrum measurements with a scanning laser interferometer over the 1 MHz frequency range. The new modes produced reveal the distinctive features of the nonlinear resonance mechanism: hysteresis, bistability and avalanche-like dynamics. Unlike that of the excitation frequency, their spatial distribution is confined strictly around the sources of nonlinearity (defects) and is used for the multi-frequency C-scan imaging of flaws that are invisible in the mono-frequency NDE regime. The series of images for various frequency lines is applied to remove background noise and to enhance the object to be identified by linear and nonlinear image processing. The results obtained for the fractured defects (impacts, cracks, delaminations, welded-joints) in a number of materials (CFRP, C-C/SiC, etc.) and components demonstrate evident benefits of the cumulative multi-frequency NDE for defect recognition and imaging.
Keywords :
flaw detection; harmonics; image enhancement; light interferometers; measurement by laser beam; object recognition; ultrasonic imaging; ultrasonic materials testing; 1 MHz; 20 to 40 kHz; defect imaging; defect recognition; flaws; fracture defects; image enhancement; intense acoustic wave excitation; linear image processing; modulation side-bands; multi-frequency ultrasonic nondestructive evaluation; nonlinear image processing; nonlinear response; nonlinear spectrum; object identification; scanning laser interferometer; ultra-frequency pairs; ultra-harmonics; ultra-subharmonics; Acoustic measurements; Acoustic waves; Background noise; Frequency measurement; Hysteresis; Image recognition; Laser excitation; Laser modes; Resonance; Ultrasonic imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2004 IEEE
ISSN :
1051-0117
Print_ISBN :
0-7803-8412-1
Type :
conf
DOI :
10.1109/ULTSYM.2004.1417816
Filename :
1417816
Link To Document :
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