• DocumentCode
    2970835
  • Title

    Crosstalk evaluation, suppression and modeling in 3D through-strata-via (TSV) network

  • Author

    Xu, Zheng ; Beece, Adam ; Zhang, Dingyou ; Chen, Qianwen ; Chen, Kuan-Neng ; Rose, Kenneth ; Lu, Jian-Qiang

  • Author_Institution
    Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2010
  • fDate
    16-18 Nov. 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Through-strata-via (TSV) is regarded as a critical component in 3D integration that extends Moore´s Law. This paper reports on TSV crosstalk performance under high speed operations using a 3D electromagnetic field solver and a SPICE simulator in both the frequency domain and time domain. Impacts of the rise time, the TSV pitch/height, the substrate resistivity and the guarding TSV termination on crosstalk noise are studied. Effects of adjacent aggressors and their switching patterns on time delay and peak noise of the victim TSV signal are evaluated. For large and dense TSV networks, crosstalk matrices of different TSV line/array arrangements are investigated at certain frequency points, detailing the coupling noise levels among these TSVs. Furthermore, the frequency dependent near-end crosstalk (NEXT) and far-end crosstalk (FEXT) are accurately modeled by SPICE tools.
  • Keywords
    SPICE; crosstalk; electromagnetic fields; integrated circuit noise; three-dimensional integrated circuits; time-frequency analysis; 3D electromagnetic field solver; 3D integration; 3D through-strata-via network; Moore´s Law; SPICE simulator; crosstalk evaluation; crosstalk matrix; crosstalk modeling; crosstalk noise; crosstalk suppression; far-end crosstalk; frequency domain; near-end crosstalk; time domain; Crosstalk; Delay effects; Noise; Receivers; Substrates; Switches; Through-silicon vias; 3D integration; Crosstalk; Modeling; TSV;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    3D Systems Integration Conference (3DIC), 2010 IEEE International
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4577-0526-7
  • Type

    conf

  • DOI
    10.1109/3DIC.2010.5751477
  • Filename
    5751477