Title :
On Compact HBT RF Noise Modeling
Author :
Rudolph, Matthias ; Heymann, Peter
Author_Institution :
Ferdinand-Braun-Inst. fur Hochstfrequenztechnik, Berlin
Abstract :
Accurate RF noise modeling of heterojunction bipolar transistors requires a proper model for the correlation of the shot-noise sources based on the respective time constant. This is incompatible with the present large-signal models, which, therefore, rely on non-correlated shot-noise sources and are not capable of predicting the RF noise with sufficient accuracy. In this paper, we propose a new configuration of the shot-noise sources which approximates the correlation by taking advantage of the large-signal model´s equivalent circuit topology. The model is verified by measurements.
Keywords :
equivalent circuits; heterojunction bipolar transistors; semiconductor device models; semiconductor device noise; shot noise; HBT; RF noise modeling; equivalent circuit topology; heterojunction bipolar transistors; shot-noise sources; Circuit noise; Delay effects; Equivalent circuits; Heterojunction bipolar transistors; Integrated circuit modeling; Integrated circuit noise; Radio frequency; Semiconductor device noise; Topology; White noise; Heterojunction bipolar transistor; Noise; Semiconductor device noise; Shot noise; White noise; equivalent circuit; semiconductor device modeling;
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2007.380076