DocumentCode :
2973587
Title :
Spectral measurement with a UV linear-variable optical filter microspectrometer
Author :
Emadi, Arvin
Author_Institution :
Dept. ME/EI, Delft Univ. of Technol., Delft, Netherlands
fYear :
2011
fDate :
28-31 Oct. 2011
Firstpage :
420
Lastpage :
423
Abstract :
This paper presents the design, fabrication and spectral measurements of an Ultra-Violet (UV) Linear Variable Optical Filter (LVOF)-based micro-spectrometer operating in the 300 nm - 400 nm wavelength range. The UV LVOF has been fabricated in an IC-Compatible process using resist reflow. Characterization of the LVOF, by passing monochromatic light through the LVOF, shows high linearity of the profile. The filter provides the possibility to have a robust high-resolution microspectrometer in the UV on a CMOS chip. Spectrum of a Mercury lamp has been measured using the UV LVOF-microspectrometer with 0.5 nm spectral resolution.
Keywords :
optical design techniques; optical fabrication; optical filters; ultraviolet spectrometers; UV linear-variable optical filter microspectrometer; resist reflow; spectral measurement; CMOS integrated circuits; Cameras; Cavity resonators; Fabrication; Hafnium compounds; Optical filters; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2011 IEEE
Conference_Location :
Limerick
ISSN :
1930-0395
Print_ISBN :
978-1-4244-9290-9
Type :
conf
DOI :
10.1109/ICSENS.2011.6127349
Filename :
6127349
Link To Document :
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