Title :
Hot-Switching Test of Non-Contact Type MEMS Switch
Author :
Shim, Eun Sub ; Park, Jaehong ; Choi, Wooyeol ; Kim, Youngmin ; Kwon, Youngwoo ; No, Jong Seon ; Nam, Sangwook ; Dong-Il Cho
Author_Institution :
Seoul Nat. Univ., Seoul
Abstract :
This paper presents the performance and power handling properties of a capacitive MEMS switch. The switch is a completely non-contact-type switch built with several capacitors that contain air gaps, and free from contact failures that frequently occur in contact-type switches. The switch was designed for 24 GHz automotive radar applications, and the average RF performance of the fabricated switches includes insertion loss of 0.5 dB and isolation of 20 dB at 24 GHz. The lifetime, power-handling properties, and linearity are examined in a hot-switching mode. After 109 continuous cycles in a hot-switching mode with 18 mW RF input power, mechanical failures or RF performance degradation were not detected. Power handling capacity of 0.9 W under hot-switching condition was achieved.
Keywords :
life testing; microswitches; microwave switches; RF input power; automotive radar application; capacitive MEMS switch; capacitor; frequency 24 GHz; hot-switching test; insertion loss; lifetime; linearity; loss 0.5 dB; noncontact type MEMS switch; power 0.9 W; power 18 mW; power handling capacity; power handling property; Air gaps; Automotive engineering; Capacitors; Contacts; Microswitches; Performance loss; Radar applications; Radio frequency; Switches; Testing; RF MEMS; lifetime; linearity; power handling; switch;
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2007.380100