DocumentCode :
2974419
Title :
On-Chip Interconnects Modeling in Time-Domain using the Explicit DuFort-Frankel Algorithm
Author :
Matthaiou, M. ; Konstantinou, K. ; Yioultsis, T.V.
Author_Institution :
Aristotle Univ. of Thessaloniki, Thessaloniki
fYear :
2007
fDate :
3-8 June 2007
Firstpage :
1963
Lastpage :
1966
Abstract :
In this paper, a tractable time domain scheme is proposed for the effective modeling of microwave planar structures. Our study relies on the DuFort-Frankel algorithm (DF) which is in principle an alternative of the conventional finite-difference time-domain (FDTD) technique but yields unconditionally stable estimates and is more accurate. We focus on the integrated stripline circuits since they are less susceptible to radiation and dispersion effects compared to microstrips. A quasi-static approximation was adopted and a comprehensive field characterization is achieved by discretizing the time and space into cells and thereafter applying the Maxwell´s equations and boundary conditions. Finally, the frequency dependent circuit parameters, namely the per-unit length (p.u.l) resistance and conductance, were estimated using the fundamental laws of electromagnetism.
Keywords :
Maxwell equations; electromagnetism; integrated circuit interconnections; strip line circuits; time-domain analysis; Maxwell´s equation; boundary condition; comprehensive field characterization; electromagnetism; explicit DuFort-frankel algorithm; integrated stripline circuits; microwave planar structure modeling; on-chip interconnect modeling; quasistatic approximation; tractable time domain scheme; Boundary conditions; Dispersion; Finite difference methods; Integrated circuit interconnections; Integrated circuit yield; Maxwell equations; Microstrip; Stripline; Time domain analysis; Yield estimation; FDTD methods; eddy currents; numerical analysis; stripline circuits; transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
ISSN :
0149-645X
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2007.380196
Filename :
4264249
Link To Document :
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