• DocumentCode
    2977757
  • Title

    In-service life consumption estimation in power modules

  • Author

    Musallam, Mahera ; Johnson, C. Mark ; Yin, Chunyan ; Lu, Hua ; Bailey, Chris

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Univ. of Nottingham, Nottingham
  • fYear
    2008
  • fDate
    1-3 Sept. 2008
  • Firstpage
    76
  • Lastpage
    83
  • Abstract
    Health management and reliability form a fundamental part of the design and development cycle of electronic products. In this paper compact real-time thermal models are used to predict temperatures of inaccessible locations within the power module. These models are then combined with physics of failure based reliability analysis to provide in-service predictions of crack propagation in solder layers and at the bond wire joints as a result of thermal cycling. The temperature estimates are combined with lifetime based reliability models to provide a tool for life consumption monitoring. Rainflow counting algorithms are applied to the temperature vs. time data to extract the occurrence frequencies of different thermal cycling ranges. Knowledge of the life consumed for each different cycle then allows the remaining life time to be estimated under arbitrary operational conditions. The technique can be employed to provide functions such as life consumption monitoring and prognostic maintenance scheduling.
  • Keywords
    PWM power convertors; bridge circuits; cracks; failure analysis; insulated gate bipolar transistors; lead bonding; life testing; power semiconductor devices; semiconductor device reliability; solders; thermal management (packaging); IGBT module; bond wire joint; crack propagation; electronic products; failure-based reliability analysis; health management; in-service life consumption estimation; inductively-loaded PWM full bridge converter; power module; prognostic maintenance scheduling; rainflow counting algorithm; real-time thermal model; solder layers; thermal cycling; Bonding; Condition monitoring; Failure analysis; Life estimation; Lifetime estimation; Multichip modules; Physics; Predictive models; Temperature; Wire; IGBT; Modelling; Prognosis; Pulse Width Modulation (PWM) Thermal stress; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Motion Control Conference, 2008. EPE-PEMC 2008. 13th
  • Conference_Location
    Poznan
  • Print_ISBN
    978-1-4244-1741-4
  • Electronic_ISBN
    978-1-4244-1742-1
  • Type

    conf

  • DOI
    10.1109/EPEPEMC.2008.4635247
  • Filename
    4635247