Thermoelectric transfer difference of thermal converters measured with a Josephson source

Author

Burroughs, C.J. ; Benz, S.P. ; Hamilton, C.A. ; Harvey, T.E. ; Kinard, J.R. ; Lipe, T.E. ; Sasaki, H.

Author_Institution

Nat. Inst. of Stand. & Technol., Boulder, CO, USA

fYear

1998

fDate

6-10 July 1998

Firstpage

643

Lastpage

644

Abstract

We have measured the thermoelectric transfer difference of two thermal voltage converters using a Josephson source and compared the results to similar measurements made with a conventional semiconductor source. Both sources use the fast reversed DC method. The Josephson source is an array of 16 384 superconductor-normal-superconductor Josephson junctions that is rapidly switched between voltage states of +0.5 V, 0 V, and -0.5 V. A marginally significant difference is detected between measurements with the two different sources.

Keywords

convertors; measurement uncertainty; superconductor-normal-superconductor devices; transfer standards; voltage measurement; waveform analysis; AC-DC difference; Josephson source; extrapolation; fast reversed DC method; rapidly switched between voltage states; superconductor-normal-superconductor junction array; thermal voltage converters; thermoelectric transfer difference; uncertainty; Electrical resistance measurement; Fluctuations; Josephson junctions; Laboratories; Military computing; NIST; Switches; Thermoelectricity; US Government; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 1998 Conference on

Conference_Location

Washington, DC, USA

Print_ISBN

0-7803-5018-9

Type

conf

DOI

10.1109/CPEM.1998.700133

Filename

700133