DocumentCode
2980353
Title
Effects of parasitics on the control of voltage source inverters
Author
Kerkman, Russel J. ; Leggate, David ; Schlegel, David W. ; Winterhalter, Craig
Author_Institution
Div. of Standard Drives, Rockwell Autom., Mequon, WI, USA
Volume
2
fYear
2001
fDate
2001
Firstpage
1141
Abstract
Advancements in AC industrial drives have been propelled through improvements in power electronics and control hardware. Improvements in IGBTs allowed faster switching speeds, which provides lower thermal losses. Digital signal processors and improved control algorithms allow AC drives to address applications previously handled by DC drives. Capacitive coupling between the IGBT, power structure and control platform components influence drive dynamics and contributes to signal and waveform distortion. This differential and common mode capacitance is often disregarded as “parasitics” and not considered in designing the control. This paper decouples the major contributors to motor waveform distortion, analyzes them, quantifies them, and presents a correction strategy. Simulations validate the analysis and experimental results demonstrate the strategy´s benefits
Keywords
AC motor drives; DC-AC power convertors; bipolar transistor switches; control system analysis; insulated gate bipolar transistors; invertors; power bipolar transistors; power semiconductor switches; voltage control; AC industrial drives; IGBTs; VSI control; control algorithms; control hardware; control platform; correction strategy; drive dynamics; motor waveform distortion; parasitics effects; power electronics; power structure; signal distortion; switching speed; thermal losses; voltage source inverters; waveform distortion; Digital signal processors; Electronics industry; Hardware; Industrial control; Insulated gate bipolar transistors; Inverters; Power electronics; Process control; Propulsion; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 2001. APEC 2001. Sixteenth Annual IEEE
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-6618-2
Type
conf
DOI
10.1109/APEC.2001.912510
Filename
912510
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