Title :
Qualification methodology for sub-micron ICs at the Low Noise Underground Laboratory of Rustrel
Author :
Lesea, A. ; Castellani-Coulié, K. ; Waysand, G. ; Le Mauff, J. ; Sudre, C.
Author_Institution :
Xilinx, San Jose, CA, USA
Abstract :
Alpha contamination has become a major concern in ICs. To qualify packaging solutions for commercial, industrial, and aerospace/defense components, a program is described. The chosen methodology associates the use of real time testing in altitude and underground environments. Experiments are performed on Xilinx FPGAs. Goals, experiment design, statistical confidence, initial results are analyzed and discussed.
Keywords :
field programmable gate arrays; integrated circuit design; integrated circuit packaging; integrated circuit testing; Low Noise Underground Laboratory; Xilinx FPGA; aerospace-defense components; alpha contamination; commercial components; industrial components; submicron IC; Aerospace industry; Aerospace testing; Alpha particles; Contamination; Defense industry; Field programmable gate arrays; Laboratories; Neutrons; Packaging; Qualifications; Alpha contamination; FPGA; Low Noise; Real time testing; SER; Underground test;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205485
