Large signal dielectric characterization measurement for integrated passive devices

Author

Chen, Rengang ; Strydom, Johan T. ; Zhao, Lingyin ; van Wyk, J.D.

Author_Institution

Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA

Volume

2

fYear

2001

fDate

2001

Firstpage

1203

Abstract

Many of the existing methods of dielectric characterization measurement are based on small signal measurement. Through those methods, some important information, such as dielectric constant at different voltages, a critical concern for integrating passive modules, cannot be obtained. This paper presents a new method to measure dielectric characterization under resonant and constant current conditions for ranges up to 850 V and 10 A. With this circuit, the characteristics of dielectric materials under representative large signal renditions and time down to 1 μs can be found

Keywords

capacitors; dielectric materials; dielectric measurement; measurement systems; snubbers; 10 A; 850 V; capacitors; dielectric constant; in-situ snubber-capacitor measurement circuit; integrated passive devices; large signal dielectric characterization measurement; passive modules integration; resonant snubber dielectric measurement circuit; small signal measurement; Capacitance measurement; Capacitors; Circuit testing; Dielectric devices; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Power electronics; Power measurement; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Applied Power Electronics Conference and Exposition, 2001. APEC 2001. Sixteenth Annual IEEE

Conference_Location

Anaheim, CA

Print_ISBN

0-7803-6618-2

Type

conf

DOI

10.1109/APEC.2001.912518

Filename

912518