Title :
Low cost TID testing of COTS components
Author :
Barnard, A. ; Steyn, W.H.
Author_Institution :
Dept. of Electr. & Electron. Eng., Stellenbosch Univ., Stellenbosch, South Africa
Abstract :
A low cost methodology for testing components at intermediate TID rates for use in South African space projects is presented. The test results are used to evaluate this approach´s viability and identify aspects to improve.
Keywords :
dosimetry; electron device testing; space vehicle electronics; COTS component; South African space project; TID testing; commercial off the shelf component; intermediate TID rate; low cost methodology; total ionization dose; Aerospace testing; Biological materials; Costs; Gravity; Insects; Pneumatic systems; Radiation safety; Satellites; Shafts; Test facilities; Aerospace testing; Radiation effects; Test facilities;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205562
