DocumentCode :
2982992
Title :
Grain Boundary Layer Cermaic Single Layer chip Capacitor for Microwave Circuit
Author :
Chao, Cheng ; Caiyang ; Feng, Yangjun ; Long, Fengyi ; Haifei, Zhao
Author_Institution :
Guangzhou Summit Microelectron. Co. Ltd., Guangzhou
fYear :
2007
fDate :
18-21 April 2007
Firstpage :
1
Lastpage :
1
Abstract :
The relationship of the composition and properties of donor doping SrTiO3 semiconductor ceramic that sintered in the reducing atmosphere were studied. Through equivalent circuit analysis and XRD, SEM, we discussed the mechanism that grain boundaries effect and characteristics affected ceramic performance, which made the dielectric constant of grain boundary layer ceramic substrate for single layer chip capacitor are adjustable (10000~50000), and the capacitance change rate was low(lesplusmn4.7%~lesplusmn22%), and the adaptable temperature range was wide (-55degC~+125degC). By sputtering and electroplating, the ceramic substrates were plated electrode. By photolithography, corrosion and precision machining , the substrates with electrode were manufactured into general single layer chip capacitor, surface mounted single layer chip capacitor, multi-pad single layer chip capacitor and single layer chip capacitor array for microwave circuit.
Keywords :
X-ray diffraction; ceramic capacitors; corrosion; electroplating; grain boundaries; machining; microwave circuits; permittivity; photolithography; scanning electron microscopy; semiconductor doping; sintering; sputtering; strontium compounds; SEM; SrTiO3; XRD; corrosion; dielectric constant; donor doping; electroplating; equivalent circuit analysis; grain boundaries effect; grain boundary layer ceramic substrate; microwave circuit; multipad capacitor; photolithography; precision machining; semiconductor ceramic; single layer chip capacitor; sintering; sputtering; surface mounted capacitor; temperature -55 C to 125 C; Atmosphere; Capacitors; Ceramics; Circuit analysis; Dielectric substrates; Electrodes; Equivalent circuits; Grain boundaries; Microwave circuits; Semiconductor device doping; dielectric constant; grain boundary layer; series product; single layer chip capacitor; temperature characteristic;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology, 2007. ICMMT '07. International Conference on
Conference_Location :
Builin
Print_ISBN :
1-4244-1048-7
Type :
conf
DOI :
10.1109/ICMMT.2007.381432
Filename :
4266191
Link To Document :
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