Title :
Sea of leads: a disruptive paradigm for a system-on-a-chip (SoC)
Author :
Naeemi, A. ; Patel, G.S. ; Bakir, M.S. ; Zarkesh-Ha, P. ; Martin, K.P. ; Meindl, J.D.
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
The authors show that Sea of leads (SoL) is a disruptive paradigm for system-on-a-chip (SoC) because it intends to use wafer-level batch fabrication of ultra high density (>10/sup 4//cm/sup 2/) x-y-z compliant input/output leads and packages as well as wafer level DC/AC testing and burn-in to enhance performance, cost, size, weight, and reliability of a mixed signal SoC.
Keywords :
integrated circuit technology; mixed analogue-digital integrated circuits; DC/AC testing; burn-in testing; mixed-signal system-on-a-chip; package; sea-of-leads technology; ultra-high-density input/output leads; wafer-level batch fabrication; Delay; Fabrication; Integrated circuit interconnections; Repeaters; Solid state circuits; Stochastic processes; System-on-a-chip;
Conference_Titel :
Solid-State Circuits Conference, 2001. Digest of Technical Papers. ISSCC. 2001 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-6608-5
DOI :
10.1109/ISSCC.2001.912638
