Title :
Effectiveness of internal vs. external SEU scrubbing mitigation strategies in a Xilinx FPGA: Design, test, and analysis
Author :
Berg, Melanie ; Poivey, C. ; Petrick, D. ; Espinosa, D. ; Lesea, Austin ; LaBel, K. ; Friendlich, M. ; Kim, H. ; Phan, Anthony
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
A comparison of two scrubbing mitigation schemes for Xilinx field programmable gate array (FPGA) devices is presented. The design of the scrubbers is briefly discussed along with an examination of mitigation limitations. Heavy ion data are then presented and analyzed.
Keywords :
field programmable gate arrays; logic design; logic testing; SEU scrubbing mitigation strategies; Xilinx FPGA; field programmable gate array design; heavy ion data; single event unit; Circuit faults; Clocks; Field programmable gate arrays; Logic devices; Protection; Random access memory; Read-write memory; Reconfigurable logic; Space technology; Testing; FPGA; Reconfiguration; Scrubbing; Xilinx;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205603
