Multiple fault diagnosis in combinational networks

Author

Macii, Enrico ; Wolf, Tara

Author_Institution

Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA

Volume

1

fYear

1994

fDate

3-5 Aug 1994

Firstpage

205

Abstract

Prime faults are introduced for the study of multiple fault diagnosis in combinational circuits. It is shown that every multiple fault in a network can be represented by a functionally equivalent fault with prime faults as its only components. Masking and covering relations among faults are defined and used to significantly simplify multiple fault analysis and test generation. An efficient algorithm that generates a multiple fault detection test set and identifies any redundancy is presented. Suggestions for designing networks to yield a minimum number of tests in the multiple fault detection test set are included

Keywords

combinational circuits; design for testability; fault diagnosis; logic design; logic testing; redundancy; combinational networks; covering relations; fault detection test set; functionally equivalent fault; masking relations; multiple fault diagnosis; prime faults; redundancy identification; test generation; Analytical models; Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Fault detection; Fault diagnosis; Intelligent networks; Redundancy; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on

Conference_Location

Lafayette, LA

Print_ISBN

0-7803-2428-5

Type

conf

DOI

10.1109/MWSCAS.1994.519223

Filename

519223