• DocumentCode
    298370
  • Title

    Competitive learning: what are the circuit limitations?

  • Author

    McNeill, Dean K. ; Card, Howard C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Manitoba Univ., Winnipeg, Man., Canada
  • Volume
    1
  • fYear
    1994
  • fDate
    3-5 Aug 1994
  • Firstpage
    461
  • Abstract
    This paper examines issues relating to analog CMOS circuit implementation of the soft competitive neural learning algorithm. Simulations of a proposed implementation have been conducted based on hardware models constructed from actual measurements of 1.2 μm CMOS analog components, primarily (nonlinear) Gilbert multipliers and associated circuits. We have used these same components in the past to construct hardware versions of contrastive Hebbian learning and delta learning. The chips with contrastive Hebbian learning have been tested and observed to perform correctly on associative learning tasks. In the present study, simulations using these same empirical hardware models demonstrate that a generalized version of the soft competitive learning algorithm is capable of discovering appropriate features in an unsupervised learning mode. It has also been found that an in-circuit version of the soft competitive learning algorithm is well suited to fabrication in analog CMOS circuitry. Inherent fabrication variations, such as transistor threshold variation and circuit noise, do not significantly impact the performance of the algorithm on a selected test problem. Multiplier zero crossing offsets were Initially found to greatly degrade network performance, but this effect was overcome by imposing minimum thresholds on weight updates, which require the addition of a small amount of thresholding circuitry
  • Keywords
    CMOS analogue integrated circuits; Hebbian learning; analogue multipliers; neural chips; unsupervised learning; 1.2 micron; analog CMOS circuit; associative learning; competitive learning; contrastive Hebbian learning; delta learning; fabrication; hardware models; multiplier zero crossing offsets; noise; nonlinear Gilbert multipliers; simulation; soft neural algorithm; transistor thresholds; unsupervised learning; CMOS analog integrated circuits; Circuit simulation; Circuit testing; Fabrication; Hardware; Hebbian theory; Performance evaluation; Semiconductor device measurement; Semiconductor device modeling; Unsupervised learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
  • Conference_Location
    Lafayette, LA
  • Print_ISBN
    0-7803-2428-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1994.519279
  • Filename
    519279