Title :
Conditional dependence in distributed detection: How far can we go?
Author :
Chen, Hao ; Varshney, Pramod K. ; Chen, Biao
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., Syracuse, NY, USA
fDate :
June 28 2009-July 3 2009
Abstract :
Distributed detection with conditionally independent observations at local sensors is well understood. The problem becomes significantly more complicated when dependence is present among sensor observations. In this paper, we attempt to make progress in our understanding of the dependent observation case. Toward this end, we present a new hierarchical model by introducing a hidden or latent variable; this model attempts to present a unified framework for distributed detection with conditionally dependent or independent observations. By a close examination of this model, we identify a class of distributed detection problems with conditionally dependent observations whose optimal sensor signaling structure resembles that of the independent case. This class of problems exhibits a decoupling effect on the form of the optimal local decision rules, much in the same way as the conditionally independent case. Important cases of this class of problems include both the previously known Gaussian case under certain parameter regimes as well as several problems first introduced in this paper. An example is given to illustrate the proposed design approach.
Keywords :
distributed sensors; conditional dependence; conditionally dependent observation; conditionally independent observation; decoupling effect; distributed detection problem; hierarchical model; local sensors; optimal local decision rules; optimal sensor signaling structure; sensor observation; Design optimization; Light rail systems; NP-complete problem; Performance analysis; Quantization; Random variables; Sensor fusion; Signal processing; Source coding; Testing; Dependent Observation; Distributed Detection; Hierarchical Independence Model; Quantization;
Conference_Titel :
Information Theory, 2009. ISIT 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4312-3
Electronic_ISBN :
978-1-4244-4313-0
DOI :
10.1109/ISIT.2009.5205665