Title :
The development of a simple TRL microstrip calibration and test fixture suitable for measurements at cryogenic temperatures
Author :
van Niekerk, C. ; Meyer, P.
Author_Institution :
Dept. of Electr. & Electron. Eng., Stellenbosch Univ., South Africa
Abstract :
The development of a TRL (thru/reflect/line) calibration and test fixture for vector network analyser measurements of microwave transistors at cryogenic temperatures, is presented. While capable of withstanding the severe environmental changes incurred by cooling to low temperatures, the fixture is simpler than similar existing fixtures. Measurements are presented to illustrate the repeatability of the fixture
Keywords :
S-parameters; UHF measurement; calibration; circuit testing; cryogenic electronics; high electron mobility transistors; microstrip components; microwave measurement; microwave transistors; network analysers; test equipment; 1 to 6 GHz; Fujitsu FHR02FH; HEMT; cooling; cryogenic temperatures; low temperatures; microwave transistors; severe environmental changes; simple TRL microstrip calibration fixture; test fixture; thru/reflect/line fixture; vector network analyser measurements; Calibration; Contacts; Cooling; Cryogenics; Fixtures; Microstrip; Microwave measurements; Pins; Temperature; Testing;
Conference_Titel :
AFRICON, 1996., IEEE AFRICON 4th
Conference_Location :
Stellenbosch
Print_ISBN :
0-7803-3019-6
DOI :
10.1109/AFRCON.1996.563017
