Title :
High-Mobility Fully-Depleted Thin-Film SOS MOSFET´S
Author :
Roser, M. ; Clayton, S.R. ; de la Houssaye, P.R. ; Garcia, G.A.
Author_Institution :
Naval Command, Control, and Ocean Surveillance Center
Keywords :
Circuit testing; Electron mobility; Germanium silicon alloys; Length measurement; MOS devices; MOSFET circuits; Sea measurements; Silicon germanium; Thickness measurement; Thin film transistors;
Conference_Titel :
Device Research Conference, 1992. Digest. 50th Annual
Conference_Location :
Cambridge, MA, USA
DOI :
10.1109/DRC.1992.671899
