Title :
Accurate and efficient evaluation of circuit yield and yield gradients
Author :
Feldmann, Peter ; Director, Stephen W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
A method is described for estimating the yield and yield gradient based on a priori geometric approximation of the acceptability region in the disturbance space. Circuit performance macromodeling is used to construct the acceptability region approximation. While yield evaluation can be carried out in either the performance space or parameter space, it is shown that for monolithic integrated circuits, the gradient of yield can only be estimated accurately in the disturbance space.<>
Keywords :
circuit analysis computing; monolithic integrated circuits; a priori geometric approximation; circuit performance macromodelling; circuit yield; monolithic integrated circuits; parameter space; performance space; yield gradients; Circuit analysis; Circuit optimization; Fabrication; Fluctuations; Integrated circuit yield; Monolithic integrated circuits; Performance analysis; Performance gain; Yield estimation; Zinc;
Conference_Titel :
Computer-Aided Design, 1990. ICCAD-90. Digest of Technical Papers., 1990 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-2055-2
DOI :
10.1109/ICCAD.1990.129857
