DocumentCode :
2987454
Title :
Power Reduction of Functional Units Considering Temperature and Process Variations
Author :
Kannan, Deepa ; Shrivastava, Aviral ; Bhardwaj, Sarvesh ; Vrudhula, Sarma
Author_Institution :
Arizona State Univ., Tempe
fYear :
2008
fDate :
4-8 Jan. 2008
Firstpage :
533
Lastpage :
539
Abstract :
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured processors. Both power density and process variations have a significant impact on the leakage power. Therefore, power optimization techniques should be sensitive to the variation in leakage power due to both temperature as well as process variations. Operation to functional units binding mechanism (OFBM) is the mechanism to dynamically issue operations to functional units (FUs) in superscalar processors. We propose a leakage-aware OFBM (LA-OFBM), which is both temperature and process variation aware. Our experimental results demostrate that LA-OFBM reduces the mean and standard deviation of the total energy consumption of ALUs by 18%, and 46% respectively, as compared to the traditional OFBM, without any performance penalty.
Keywords :
low-power electronics; microprocessor chips; functional units binding mechanism; leakage power; power density; power optimization; power reduction; process variations; superscalar processors; temperature variation; CMOS technology; Computer aided manufacturing; Electronic design automation and methodology; Energy consumption; Informatics; Laboratories; Microarchitecture; Microprocessors; Temperature sensors; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2008. VLSID 2008. 21st International Conference on
Conference_Location :
Hyderabad
ISSN :
1063-9667
Print_ISBN :
0-7695-3083-4
Type :
conf
DOI :
10.1109/VLSI.2008.81
Filename :
4450554
Link To Document :
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