Title :
Global mapping of bidirectional reflectance and albedo for the-EOS MODIS project: the algorithm and the product
Author :
Wanner, Wolfgang ; Strahler, Alan H. ; Muller, Jan-Peter ; Barnsley, Mike ; Lewis, Philip ; Li, Xiaowen ; Schaaf, Crystal L Barker
Author_Institution :
Center for Remote Sensing, Boston Univ., MA, USA
Abstract :
The MODIS BRDF/Albedo Product will provide multiband BRDF parameters and albedo measures at 1 km resolution globally every 16 days, utilizing both MODIS and MISR data. The BRDF models to be used are kernel-driven semiempirical models based mostly on Ross- and Li-kernels. These are capable of fitting directional data observed for different land cover types by Kimes well
Keywords :
geophysical techniques; remote sensing; EOS MODIS project; Li-kernel; Ross kernel; albedo; algorithm; bidirectional reflectance; geophysical measurement technique; global mapping; land cover type; land surface remote sensing; multiband BRDF parameters; optical imaging; semiempirical model; terrain mapping; visible infrared IR method; Atmosphere; Bidirectional control; Earth Observing System; Land surface; Layout; Lighting; MODIS; Reflectivity; Sea surface; Surface topography;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1995. IGARSS '95. 'Quantitative Remote Sensing for Science and Applications', International
Conference_Location :
Firenze
Print_ISBN :
0-7803-2567-2
DOI :
10.1109/IGARSS.1995.520327
