DocumentCode
298867
Title
Interferogram quality versus digital elevation model characteristics
Author
Vadon, Hélène
Author_Institution
CNES, Toulouse, France
Volume
1
fYear
34881
fDate
10-14 Jul1995
Firstpage
541
Abstract
Discusses the use of radar remote sensing for the derivation of land surface topography. CNES has always been in favor of using Digital Elevation Models (DEMs), when available, for the production of topography free interferograms. The reason is that they are available on numerous world wide areas, and that they allow the direct production of an interpretable interferogram from 2 data takes. Any differential method will always require 3 data takes at minimum, and will put further requirements on them. DEM types are numerous and can be defined by the following characteristics: its reference Earth ellipsoid-its type of coordinates-so called “geographical”: each point is referenced by its latitude and longitude-so called “cartographic”: each point is expressed in meters, representing the projection of the terrain on a geometrical surface (e.g. UTM and Lambert projections)-its mesh size: DEMs are data files, organized in records of fixed data point intervals. The DEMs used until now at CNES have had data point intervals ranging from 20 m (SPOT satellite generated DEMs) to 200 m (DEMs generated from large scale maps). Although one cannot quantify the relation between the DEM mesh size and the elevation precision, it is obvious that narrow cell DEMs always have a more accurate elevation than large mesh size ones
Keywords
geodesy; geophysical techniques; radar applications; radar imaging; remote sensing by radar; spaceborne radar; topography (Earth); DEM; digital elevation model; geodesy; interferogram quality; land surface topography; measurement technique; radar remote sensing; terrain mapping; topography free interferogram; Data processing; Digital elevation models; Discrete event simulation; Earth; Layout; Orbital calculations; Production; Radar imaging; Spaceborne radar; Surfaces;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 1995. IGARSS '95. 'Quantitative Remote Sensing for Science and Applications', International
Conference_Location
Firenze
Print_ISBN
0-7803-2567-2
Type
conf
DOI
10.1109/IGARSS.1995.520448
Filename
520448
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