DocumentCode :
2989782
Title :
Dynamic Mode, Probe Based High Density Data Storage: A collaborative effort with IBM, Zurich Research Labs
Author :
Salapaka, Murti V.
Author_Institution :
Univ. of Minnesota, Minneapolis, MN
fYear :
2008
fDate :
3-5 Sept. 2008
Firstpage :
25
Lastpage :
25
Abstract :
Conventional means of storing data is primarily magnetic. The data storage densities in storing data magnetically are approaching fundamental limits. A new and promising means of achieving data storage densities in the Terabit per inch square range involves using a probe made of a sharp tip at the end of a cantilever flexure. IBM Zurich Research Labs (IBM, ZRL) has pioneered this probe based data storage technology. NanoDynamics Systems Lab. (NDSL) at University of Minnesota Minneapolis has developed new methods of interrogating matter with better resolution and at higher bandwidth. Another focus of the research at NDSL is the dynamic mode operation of this technology. The complimentary set of tools at IBM, ZRL and at NDSL has motivated a collaborative agreement between University of Minnesota and IBM. In this talk, the process by which the initial contact between the groups at IBM and NDSL was made and the means by which a common charter of research was arrived at will be described. An emphasis on some of the challenges faced caused by researchers from relatively different areas will be highlighted. The next step of formulating an IP agreement between the two establishments followed by a description of research that the agreement has facilitated will be presented. The role an NSF grant is playing in the research will be highlighted.
Keywords :
digital storage; IBM Zurich Research Labs; NanoDynamics Systems Lab; cantilever flexure; dynamic mode; probe-based high density data storage; Collaboration; Control systems; Embedded software; Fault detection; Government; Memory; Monitoring; Probes; Software safety; Technological innovation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control, 2008. ISIC 2008. IEEE International Symposium on
Conference_Location :
San Antonio, TX
ISSN :
2158-9860
Print_ISBN :
978-1-4244-2224-1
Electronic_ISBN :
2158-9860
Type :
conf
DOI :
10.1109/ISIC.2008.4635928
Filename :
4635928
Link To Document :
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