Title :
Non-Invasive Measurement of Optical Diffuse Reflectance and Cluster Analysis of the Data
Author :
Zhang, Lianshun ; Zhao, Kongyang
Author_Institution :
Coll. of Sci., Civil Aviation Univ. of China, Tianjin, China
Abstract :
Based on the non-invasive measurement of the CCD video technology, 24 measurements were made on tissue phantoms, which cover the whole range of human tissue optical properties. 24 diffuse reflectance images were obtained on the tissue phantom surfaces which contain a large amount of data. First we process the image by excel to extract the sum of image data(SUM), average (AVE), median (MID), the linear regression line of Y-axis intercept (INTERCEPT), linear regression slope (SLOPE), the average absolute deviation of the mean(AVEDEV), the square deviation (DEVSQ) and standard deviation (STDEV) as the characteristics of the diffuse reflectance image. Then the SPSS cluster analysis was used to cluster the 24 biological tissue phantoms by the diffuse reflectance image characteristics. The cluster result showed that the 24 diffuse reflectance images were clustered in group according their optical coefficients. So by this method we can predict the optical coefficient of tissue with the diffuse reflectance image.
Keywords :
CCD image sensors; bio-optics; biological tissues; biomedical optical imaging; cellular biophysics; data analysis; medical image processing; optical variables measurement; phantoms; reflectivity; regression analysis; AVE; AVEDEV; CCD video technology; DEVSQ; INTERCEPT; MID; SLOPE; SPSS cluster analysis; STDEV; SUM; Y-axis intercept linear regression line; biological tissue phantoms; data analysis; human tissue; image data average; image data median; image data sum; image processing; linear regression slope lines; mean average absolute deviation; noninvasive measurement; optical coefficients; optical diffuse reflectance images; optical properties; square deviation; standard deviation; tissue phantom surfaces; Biological tissues; Biomedical optical imaging; Optical imaging; Optical reflection; Optical scattering; Optical variables measurement; Reflectivity;
Conference_Titel :
Photonics and Optoelectronics (SOPO), 2012 Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-0909-8
DOI :
10.1109/SOPO.2012.6270432