Title :
Warpage simulation for chip-in-substrates
Author :
Jong Woon Kim ; Ju Pyo Hong ; Shan Gao ; Seog Moon Choi ; Sung Yi
Author_Institution :
Samsung Electro-Mech., Suwon, South Korea
Abstract :
In order to predict warpage of chip-in-substrate package, finite element analysis was carried out with modeling layers in chip and substrate and effective thermoelastic properties. The effects of design parameters such as pattern on the gap between chip and cavity, number of circuit layers, thickness and face direction of the chip, and gap width were investigated. The result shows that the warpage much depends on the internal structure and the effective thermoelastic properties.
Keywords :
chip scale packaging; finite element analysis; chip-in-substrate package; effective thermoelastic properties; finite element analysis; gap width; warpage simulation; Conducting materials; Conductivity; Copper; Electrons; Laboratories; Morphology; Silver; Solvents; Temperature; Tiles;
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location :
Penang
Print_ISBN :
978-1-4244-3392-6
Electronic_ISBN :
1089-8190
DOI :
10.1109/IEMT.2008.5507803