DocumentCode
2992789
Title
Excitation, observation, and ELF-MD: optimization criteria for high quality test sets
Author
Dworak, Jennifer ; Dorsey, David ; Wang, Amy ; Mercer, M. Ray
Author_Institution
Texas A&M Univ., College Station, TX, USA
fYear
2004
fDate
25-29 April 2004
Firstpage
9
Lastpage
15
Abstract
In previous work, we have shown that optimizing the number of site observations leads to more defect detection. However, for increasingly difficult defects, optimizing patterns for balanced random excitation also enhances test effectiveness. We can also reduce the effect of undetected defects by choosing tests that minimize the likelihood of field failures.
Keywords
automatic test pattern generation; circuit optimisation; failure analysis; fault diagnosis; integrated circuit testing; maximum likelihood estimation; production testing; automatic test pattern generation; defect detection; expected latency failure; high quality test sets; manufacturing defects; optimization; random excitation; Application specific integrated circuits; Automatic test pattern generation; Bridge circuits; Circuit faults; Circuit testing; Fault detection; Integrated circuit testing; Milling machines; Resource management; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
ISSN
1093-0167
Print_ISBN
0-7695-2134-7
Type
conf
DOI
10.1109/VTEST.2004.1299219
Filename
1299219
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