DocumentCode :
2992789
Title :
Excitation, observation, and ELF-MD: optimization criteria for high quality test sets
Author :
Dworak, Jennifer ; Dorsey, David ; Wang, Amy ; Mercer, M. Ray
Author_Institution :
Texas A&M Univ., College Station, TX, USA
fYear :
2004
fDate :
25-29 April 2004
Firstpage :
9
Lastpage :
15
Abstract :
In previous work, we have shown that optimizing the number of site observations leads to more defect detection. However, for increasingly difficult defects, optimizing patterns for balanced random excitation also enhances test effectiveness. We can also reduce the effect of undetected defects by choosing tests that minimize the likelihood of field failures.
Keywords :
automatic test pattern generation; circuit optimisation; failure analysis; fault diagnosis; integrated circuit testing; maximum likelihood estimation; production testing; automatic test pattern generation; defect detection; expected latency failure; high quality test sets; manufacturing defects; optimization; random excitation; Application specific integrated circuits; Automatic test pattern generation; Bridge circuits; Circuit faults; Circuit testing; Fault detection; Integrated circuit testing; Milling machines; Resource management; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
ISSN :
1093-0167
Print_ISBN :
0-7695-2134-7
Type :
conf
DOI :
10.1109/VTEST.2004.1299219
Filename :
1299219
Link To Document :
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