Title :
Excitation, observation, and ELF-MD: optimization criteria for high quality test sets
Author :
Dworak, Jennifer ; Dorsey, David ; Wang, Amy ; Mercer, M. Ray
Author_Institution :
Texas A&M Univ., College Station, TX, USA
Abstract :
In previous work, we have shown that optimizing the number of site observations leads to more defect detection. However, for increasingly difficult defects, optimizing patterns for balanced random excitation also enhances test effectiveness. We can also reduce the effect of undetected defects by choosing tests that minimize the likelihood of field failures.
Keywords :
automatic test pattern generation; circuit optimisation; failure analysis; fault diagnosis; integrated circuit testing; maximum likelihood estimation; production testing; automatic test pattern generation; defect detection; expected latency failure; high quality test sets; manufacturing defects; optimization; random excitation; Application specific integrated circuits; Automatic test pattern generation; Bridge circuits; Circuit faults; Circuit testing; Fault detection; Integrated circuit testing; Milling machines; Resource management; Test pattern generators;
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Print_ISBN :
0-7695-2134-7
DOI :
10.1109/VTEST.2004.1299219