• DocumentCode
    2992789
  • Title

    Excitation, observation, and ELF-MD: optimization criteria for high quality test sets

  • Author

    Dworak, Jennifer ; Dorsey, David ; Wang, Amy ; Mercer, M. Ray

  • Author_Institution
    Texas A&M Univ., College Station, TX, USA
  • fYear
    2004
  • fDate
    25-29 April 2004
  • Firstpage
    9
  • Lastpage
    15
  • Abstract
    In previous work, we have shown that optimizing the number of site observations leads to more defect detection. However, for increasingly difficult defects, optimizing patterns for balanced random excitation also enhances test effectiveness. We can also reduce the effect of undetected defects by choosing tests that minimize the likelihood of field failures.
  • Keywords
    automatic test pattern generation; circuit optimisation; failure analysis; fault diagnosis; integrated circuit testing; maximum likelihood estimation; production testing; automatic test pattern generation; defect detection; expected latency failure; high quality test sets; manufacturing defects; optimization; random excitation; Application specific integrated circuits; Automatic test pattern generation; Bridge circuits; Circuit faults; Circuit testing; Fault detection; Integrated circuit testing; Milling machines; Resource management; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2134-7
  • Type

    conf

  • DOI
    10.1109/VTEST.2004.1299219
  • Filename
    1299219