DocumentCode
29929
Title
Improved Model of Long-Term Gain Increases in Traveling-Wave Tubes
Author
Conversano, Ryan W. ; Goebel, Dan M.
Author_Institution
Wirz Res. Group, Univ. of California at Los Angeles, Los Angeles, CA, USA
Volume
62
Issue
2
fYear
2015
fDate
Feb. 2015
Firstpage
652
Lastpage
658
Abstract
An improved model to predict the gain increases in traveling-wave tubes (TWTs) during long-term operation is presented. The conventional gain growth model describes the pressure variation in a TWT over its life using an exponential decrease from the initial outgassing level to a constant base pressure. This model often shows an inability to capture the gain change behavior of many tubes during the transition between early life burn-in and long-term operation, leading to a significant underprediction of long-term gain increases. The model is improved here first through the introduction of another pressure-related term associated with desorption of gas from the tube´s inner surfaces that exhibits a t-1/2 time dependence. This new pressure dependence is governed by the behavior of a Langmuirian adsorption isotherm. Second, the exponential pressure decay term is separated into two terms associated with early life and long-term operation with different outgassing time constants. The improved model shows a significantly better matching of long-term TWT gain growth data compared to the conventional model. In addition, the improved model predicts a more physical pressure behavior in the TWT with time.
Keywords
adsorption; desorption; outgassing; travelling wave tubes; Langmuirian adsorption isotherm; TWT; early life burn-in; exponential decrease; exponential pressure decay term; gain change behavior; gain growth model; gas desorption; long-term gain increase model; long-term operation; outgassing level; outgassing time constant; pressure dependence; pressure variation; time dependence; traveling-wave tube; Adsorption; Attenuators; Data models; Electron tubes; Gain; Lead; Resistance; Traveling-wave tubes (TWTs);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2014.2380996
Filename
7015669
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